JPS6388742U - - Google Patents
Info
- Publication number
- JPS6388742U JPS6388742U JP18450486U JP18450486U JPS6388742U JP S6388742 U JPS6388742 U JP S6388742U JP 18450486 U JP18450486 U JP 18450486U JP 18450486 U JP18450486 U JP 18450486U JP S6388742 U JPS6388742 U JP S6388742U
- Authority
- JP
- Japan
- Prior art keywords
- pipe
- strain gauge
- crack
- gauge
- pressure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18450486U JPS6388742U (en]) | 1986-11-29 | 1986-11-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18450486U JPS6388742U (en]) | 1986-11-29 | 1986-11-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6388742U true JPS6388742U (en]) | 1988-06-09 |
Family
ID=31132243
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18450486U Pending JPS6388742U (en]) | 1986-11-29 | 1986-11-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6388742U (en]) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7319335B2 (en) | 2004-02-12 | 2008-01-15 | Applied Materials, Inc. | Configurable prober for TFT LCD array testing |
| US7330021B2 (en) | 2004-02-12 | 2008-02-12 | Applied Materials, Inc. | Integrated substrate transfer module |
| US7355418B2 (en) | 2004-02-12 | 2008-04-08 | Applied Materials, Inc. | Configurable prober for TFT LCD array test |
| US7535238B2 (en) | 2005-04-29 | 2009-05-19 | Applied Materials, Inc. | In-line electron beam test system |
| US7569818B2 (en) | 2006-03-14 | 2009-08-04 | Applied Materials, Inc. | Method to reduce cross talk in a multi column e-beam test system |
| US7602199B2 (en) | 2006-05-31 | 2009-10-13 | Applied Materials, Inc. | Mini-prober for TFT-LCD testing |
| JP2012159477A (ja) * | 2011-02-02 | 2012-08-23 | Institute Of Nuclear Safety System Inc | 亀裂サイズ推定方法 |
| WO2017006900A1 (ja) * | 2015-07-09 | 2017-01-12 | 国立研究開発法人産業技術総合研究所 | 損傷進展度測定方法および損傷進展度測定システム |
-
1986
- 1986-11-29 JP JP18450486U patent/JPS6388742U/ja active Pending
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7319335B2 (en) | 2004-02-12 | 2008-01-15 | Applied Materials, Inc. | Configurable prober for TFT LCD array testing |
| US7330021B2 (en) | 2004-02-12 | 2008-02-12 | Applied Materials, Inc. | Integrated substrate transfer module |
| US7355418B2 (en) | 2004-02-12 | 2008-04-08 | Applied Materials, Inc. | Configurable prober for TFT LCD array test |
| US7535238B2 (en) | 2005-04-29 | 2009-05-19 | Applied Materials, Inc. | In-line electron beam test system |
| US7569818B2 (en) | 2006-03-14 | 2009-08-04 | Applied Materials, Inc. | Method to reduce cross talk in a multi column e-beam test system |
| US7602199B2 (en) | 2006-05-31 | 2009-10-13 | Applied Materials, Inc. | Mini-prober for TFT-LCD testing |
| JP2012159477A (ja) * | 2011-02-02 | 2012-08-23 | Institute Of Nuclear Safety System Inc | 亀裂サイズ推定方法 |
| WO2017006900A1 (ja) * | 2015-07-09 | 2017-01-12 | 国立研究開発法人産業技術総合研究所 | 損傷進展度測定方法および損傷進展度測定システム |
| CN107835937A (zh) * | 2015-07-09 | 2018-03-23 | 国立研究开发法人产业技术综合研究所 | 用于测定损伤进展度的方法和用于测定损伤进展度的系统 |
| JPWO2017006900A1 (ja) * | 2015-07-09 | 2018-04-19 | 国立研究開発法人産業技術総合研究所 | 損傷進展度測定方法および損傷進展度測定システム |